Your challenge

Structural and compositional characterization of mineral samples

Mineral exploration identifies and evaluates areas with potential mineral resources, forming the first step in the mining value chain. Reliable resource models require precise, representative geological data, and combining structural and compositional information improves mineral classification and resource estimation.

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Our solution 1

Synchrotron X-ray Diffraction for phase analysis of mineral samples

Our expertise in synchrotron X-ray diffraction enables highly precise analysis of mineral crystal structures and phase composition, from which elemental information can be derived. With our high-throughput sample exchanger, we can measure up to 10,000 samples per day, enabling large-scale mineralogical characterisation to support robust geostatistical models and better understand mineral variability across deposits.
 

Phase Analysis

Our solution 2

Synchrotron X-ray Fluorescence for elemental analysis of mineral samples

Synchrotron X-ray fluorescence spectroscopy provides sensitive elemental analysis of mineral samples, particularly for heavier elements. In our high-throughput setup, X-ray fluorescence is measured in parallel with X-ray diffraction, enabling combined elemental and mineralogical characterization without loss of throughput. Together, X-ray diffraction and fluorescence offer complementary information that supports large-scale studies of mineral variability across deposits.
 

Elemental Analysis

TESTIMONIALS

Success stories

The level of speed, precision and accuracy on SR-XRPD data collection cannot be reached on any other method. The cooperation with ANAXAM has taken powder diffraction to the truly next level. ”

Jarkko Stenman, COO, Stenman Minerals Ab
SPECTRAFLOW

SpectraFlow Analytics AG

ANAXAM offers small and midsize companies as we are access to know-how and analytics a top level. Thanks to the partnership with ANAXAM we were already able to essentially improve our technology. We see a high potential that existing processes for industry can be further optimized and new processes can be developed.”

Tobias Füeg, Head of Engineering, SpectraFlow Analytics Ltd. 
FAQ

Answers to the most frequently asked questions

Our synchrotron X-ray diffraction (XRD) technique is suitable for analyzing a wide range of mineralogical materials, particularly where high peak resolution, sensitivity to subtle crystallographic differences, and high sample throughput are required.The high brilliance and tunable wavelength of synchrotron radiation enable precise phase identification and quantitative analysis in complex, multiphase, or fine-grained samples, including those with overlapping diffraction peaks or low crystallinity.

Our synchrotron X-ray fluorescence (XRF) technique is suitable for elemental analysis of a wide range of mineralogical materials, particularly where high sensitivity, spatially resolved chemical information, and rapid data acquisition are required. The high brilliance of synchrotron radiation enables detection of major, minor, and trace elements across a broad atomic number range, even in small, heterogeneous, or complex samples.

Precise analysis of phases in minerals can be done by Rietveld refinement of diffraction patterns obtained from synchrotron XRD. It involves determining the identity, quantity, and crystallographic structure of the different mineral components in a sample. 
 

When a mineral is irradiated with X-rays, atoms in the sample are excited and emit characteristic fluorescent X-rays with energies that are unique to each element. By measuring the energies of these emitted photons, elements are unambiguously identified, while their intensities are proportional to elemental concentrations.

Measuring X-ray diffraction (XRD) and X-ray fluorescence (XRF) simultaneously provides a powerful, complementary view of minerals by linking crystal structure and chemical composition from exactly the same sample volume and measurement conditions. The key benefit is the ability to directly correlate mineral phases with their elemental signatures. Simultaneous XRD/XRF also improves interpretation efficiency and accuracy.

Yes, of course. We are here to advise you without obligation and to find out whether we can support you. Please do not hesitate to contact us.

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