Synchrotron X-ray Diffraction for phase analysis of mineral samples
Our expertise in synchrotron X-ray diffraction enables highly precise analysis of mineral crystal structures and phase composition, from which elemental information can be derived. With our high-throughput sample exchanger, we can measure up to 10,000 samples per day, enabling large-scale mineralogical characterisation to support robust geostatistical models and better understand mineral variability across deposits.
Phase Analysis
Synchrotron X-ray Fluorescence for elemental analysis of mineral samples
Synchrotron X-ray fluorescence spectroscopy provides sensitive elemental analysis of mineral samples, particularly for heavier elements. In our high-throughput setup, X-ray fluorescence is measured in parallel with X-ray diffraction, enabling combined elemental and mineralogical characterization without loss of throughput. Together, X-ray diffraction and fluorescence offer complementary information that supports large-scale studies of mineral variability across deposits.
Elemental Analysis
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Success stories
The level of speed, precision and accuracy on SR-XRPD data collection cannot be reached on any other method. The cooperation with ANAXAM has taken powder diffraction to the truly next level. ”
SpectraFlow Analytics AG
ANAXAM offers small and midsize companies as we are access to know-how and analytics a top level. Thanks to the partnership with ANAXAM we were already able to essentially improve our technology. We see a high potential that existing processes for industry can be further optimized and new processes can be developed.”
Answers to the most frequently asked questions
Our synchrotron X-ray diffraction (XRD) technique is suitable for analyzing a wide range of mineralogical materials, particularly where high peak resolution, sensitivity to subtle crystallographic differences, and high sample throughput are required.The high brilliance and tunable wavelength of synchrotron radiation enable precise phase identification and quantitative analysis in complex, multiphase, or fine-grained samples, including those with overlapping diffraction peaks or low crystallinity.
Our synchrotron X-ray fluorescence (XRF) technique is suitable for elemental analysis of a wide range of mineralogical materials, particularly where high sensitivity, spatially resolved chemical information, and rapid data acquisition are required. The high brilliance of synchrotron radiation enables detection of major, minor, and trace elements across a broad atomic number range, even in small, heterogeneous, or complex samples.
Precise analysis of phases in minerals can be done by Rietveld refinement of diffraction patterns obtained from synchrotron XRD. It involves determining the identity, quantity, and crystallographic structure of the different mineral components in a sample.
When a mineral is irradiated with X-rays, atoms in the sample are excited and emit characteristic fluorescent X-rays with energies that are unique to each element. By measuring the energies of these emitted photons, elements are unambiguously identified, while their intensities are proportional to elemental concentrations.
Measuring X-ray diffraction (XRD) and X-ray fluorescence (XRF) simultaneously provides a powerful, complementary view of minerals by linking crystal structure and chemical composition from exactly the same sample volume and measurement conditions. The key benefit is the ability to directly correlate mineral phases with their elemental signatures. Simultaneous XRD/XRF also improves interpretation efficiency and accuracy.
Yes, of course. We are here to advise you without obligation and to find out whether we can support you. Please do not hesitate to contact us.
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