Sample preparation and pre- /post- characterization

Sample preparation and pre-/post- characterization – supporting our analytical services

For some of our analytical services, samples need to be specially prepared. We provide different kinds of sample preparation, including cutting, polishing, annealing, etc.

We also offer pre-/post-characterization with various microscope types at the Swiss Nanoscience Institute (SNI) , to support and supplement our analytical services using Neutron and Synchrotron radiation.

Selection of equipment available for sample preparation and pre-/post-characterization:

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Variety of cutting machines

  • Electrical discharge machining
  • Circular saw blade cutting
  • Wire cutting
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Variety of polishing equipment

  • Mechanical polishing up to OPS suspension
  • VibroMet
  • Electropolishing for SEM and TEM samples
  • Ion milling
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Electron Microscopes

  • SEM with different detectors (SE, in-lens, BSE and EDAX) for examining different surfaces and structures as well as elemental analysis
  • FIB for deposition and ablation of a specific region of interest of the sample
  • Environmental SEM for wet and uncoated non-conducting samples
  • TEM for investigating structures of samples with high resolution
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Atomic Force Microscopes

  • Contact and non-contact modes
  • Tapping and lift modes
  • Phase imaging
  • Lateral force microscopy
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Light and Scanning Laser Microscopes

  • Various light microscopes
  • 3D scanning laser microscopes for obtaining 3D surface profiles

Any question? Feel free to contact us!

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Our analytical tools for your questions

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Imaging

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Material distribution analysis in 3D
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Defect and porosity analysis in 3D
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Wall thickness analysis in 3D
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Nominal/actual comparison analysis in 3D
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Reverse Engineering
Imaging
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Diffraction

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Atomic phase and structural characterization
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Residual stress analysis
Diffraction
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Scattering

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Size distribution analysis
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Shape distribution analysis
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Orientation analysis
Scattering
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Spectroscopy

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Chemical imaging analysis
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Chemical characterization
Spectroscopy
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Tailor-made Infrastructure

Mechanical
Climatic
Electrical & magnetic
During manufacturing
Automation
Tailor-made Infrastructure
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Sample preparation and pre- /post- characterization

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Variety of cutting machines
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Variety of polishing equipment
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Electron Microscopes
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Atomic Force Microscopes
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Light and Scanning Laser Microscopes
Sample preparation and pre- /post- characterization
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